NANOTOOLS GMBH

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 2126
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]117

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8739310 Characterization structure for an atomic force microscope tipApr 24, 13May 27, 14[G01Q]
8723138 Electron beam source and method of manufacturing the sameFeb 09, 12May 13, 14[H01J]
8164071 Electron beam source and method of manufacturing the sameSep 30, 09Apr 24, 12[H01J]

Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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